
8 Mbit Firmware Hub
A Microchip Technology Company
SST49LF008A
Data Sheet
Table 13: Recommended System Power-up Timings
Symbol
T PU-READ1
Parameter
Power-up to Read Operation
Minimum
100
Units
μs
T PU-WRITE
1
Power-up to Write Operation
100
μs
T13.2 25085
1. This parameter is measured only for initial qualification and after a design or process change that could affect this
parameter
Table 14: Pin Impedance (V DD =3.3V, T A =25 °C, f=1 Mhz, other pins open)
Parameter
Description
Test Condition
Maximum
C I/O
1
I/O Pin Capacitance
V I/O = 0V
12 pF
C IN1
Input Capacitance
V IN = 0V
12 pF
L PIN
2
Pin Inductance
20 nH
T14.4 25085
1. This parameter is measured only for initial qualification and after a design or process change that could affect this
parameter.
2. Refer to PCI spec.
Table 15: Reliability Characteristics
Symbol
N END1
T DR1
I LTH1
Parameter
Endurance
Data Retention
Latch Up
Minimum Specification
10,000
100
100 + I DD
Units
Cycles
Years
mA
Test Method
JEDEC Standard A117
JEDEC Standard A103
JEDEC Standard 78
T15.3 25085
1. This parameter is measured only for initial qualification and after a design or process change that could affect this
parameter.
Table 16: Clock Timing Parameters
Symbol
T CYC
T HIGH
T LOW
-
-
Parameter
CLK Cycle Time
CLK High Time
CLK Low Time
CLK Slew Rate (peak-to-peak)
RST# or INIT# Slew Rate
Min
30
11
11
1
50
Max
4
Units
ns
ns
ns
V/ns
mV/ns
T16.1 25085
?2011 Silicon Storage Technology, Inc.
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